JEDEC Solid State Technology Association has released JEP200, a new standard detailing test methods for switching energy loss associated with output capacitance hysteresis in semiconductor power devices. This publication, developed by JEDEC’s JC-70.1 Gallium Nitride and JC-70.2 Silicon Carbide Subcommittees, is now available for free download from the JEDEC website. The increasing adoption of soft […]